研究業績

2008年　研究発表

レーザー補助広角３次元アトムプローブの開発と実デバイスの３次元原子レベル解析(II)

2008.5.14　マイクロビームアナリシス141委員会　第132回研究会資料　p.103-108
間山憲仁、三上素直、岩田達夫、野島　雅、谷口昌宏、尾張真則

New concepts for sample preparation on 3DAP using FIB

2008.7.1 Rouen Normandy France　Abstracts of 51th international field emission symposium p.107-108
S. Mikami, T. Kaito, T. Adachi, N. Mayama, T. Iwata, M. Nojima, M. Taniguchi, M. Owari

Shave-off depth profiling for electrochemical migration

2008.7.17 Seikei University　Abstracts of 10th international symposium on SIMS and related techniques based on ion-solid interactions at Seikei university p.19
M. Nojima, M. Fujii, M. Owari and Y. Nihei

Highly accurate shave-off depth profiling by simulation method

2008.7.17 Seikei University　Abstracts of 10th international symposium on SIMS and related techniques based on ion-solid interactions at Seikei university p.20
M. Fujii, M. Nojima, M. Owari and Y. Nihei

Characterization of environmental nanoparticles

2008.7.17 Seikei University　Abstracts of 10th international symposium on SIMS and related techniques based on ion-solid interactions at Seikei university p.33
N. Fukuhara, M. Nojima and Y. Nihei

大気環境汚中ナノ粒子のキャラクタリゼ—ション

日本分析化学会第57年会 2008.9.12　p.212
福原　渚、野島　雅、二瓶好正

X線光電子回折によるVO2/TiO2モデル触媒の構造解析

2008.9.12　p.17　日本分析化学会第57年会
宮坂真弥、鈴木篤史、野島　雅、尾張真則、二瓶好正

Multi lane shave-off profiling for build-up circuit

2008.09.22　Abstract of the 17th international workshop on inelastic ion-surface collisions p. 28
M. Fujii, Y. Ishizaki, M. Nojima, M. Owari and Y. Nihei

Discussion of shave-off profiling speed

2008.09.22　Abstract of the 17th international workshop on inelastic ion-surface collisions p. 37
M. Nojima, M. Fujii, Y. Ishizaki, M. Owari and Y. Nihei

X-ray photoelectron diffraction study on the surface structure of VOX/TiO2(110) model catalyst

2008.11.13　Abstracts of international symposium on surface and science and nanotechnology p.594
S. Miyasaka, A. Suzuki, M. Nojima, M. Owari and Y. Nihei

2008年　発表論文

社団法人日本表面化学会の発足を祝って

表面科学 (2008)　第29巻, 第8号, p 462-263
二瓶好正

科学と技術の国際競争力

化学と工業 2008年 11月号 第61巻, 第11号, p 1029
二瓶好正

強力二色X線源の開発

表面科学, 2008年3月　
第29巻，第3号, p. 193-194
鈴木篤史, 橋本明奈, 尾張真則, 野島　雅, 二瓶好正

Study on dynamics of surface structure by rapid and time-resolved X-ray photoelectron diffraction

Surface and interface analysis 2008
Vol. 40 Issue 13 p. 1646-1649
Y. Kisaka, A. Hashimoto, A. Suzuki, S. Miyasaka, M. Nojima, M. Owari and Y. Nihei

Differential photoelectron holography of Cu(100) surface by using of laboratory-level X-ray sources

Surface and interface analysis 2008
Vol. 40 Issue 13 p. 1638-1640
A. Hashimoto, A. Suzuki, Y. Kisaka, S. Miyasaka, M. Nojima, M. Owari and Y. Nihei

Holographic imaging of TiO2(110) strucure by differential photoelectron holography

Surface and interface analysis 2008
Vol. 40 Issue 13 p. 1627-1630
A. Suzuki, A. Hashimoto, M. Nojima, M. Owari and Y. Nihei

Surface structual analysis of VOX/TiO2 by X-ray photoelectron diffraction

Surface and interface analysis 2008
Vol. 40 Issue 13 p. 1650-1654
S. Miyasaka, K. Amano, M. Nojima, M. Owari and Y. Nihei

Evaluation of the instrument for three-dimensional atom probe (3DAP)

Surface and interface analysis 2008
Vol. 40 Issue 13 p. 1688-1691
T. Kaneko, S. Ito, C. Yamashita, N. Mayama, M. Nojima, M. Taniguchi and M. Owari

The stress of the needle specimen on the three-dimensional atom probe (3DAP)

Surface and interface analysis 2008
Vol. 40 Issue 13 p. 1610-1613
N. Mayama, C. Yamashita, T. Kaito, M. Nojima, M. Taniguchi and M. Owari

Development of preset-type sample stage in three-dimensional atom probe

Surface and interface analysis 2008
Vol. 40 Issue 13 p. 1696-1700
S. Ito, T. Kaneko, C. Yamashita, T. Kaito, T. Adachi, N. Mayama, M. Nojima, M. Taniguchi and M. Owari

Charge neutralization using secondary electron shower for shave-off depth profiling

Applied surface science 2008
Vol.255 p. 1351-1353
Y. Ishizaki, T. Yamamoto, M. Fujii, M. Owari and Y. Nihei

Highly accurate shave-off depth profiling by simulation method

Applied surface science 2008
Vol.255 p. 1354-1356
M. Fujii, K. Nakamura, Y. Ishizaki, M. Nojima, M. Owari and Y. Nihei

Shave-off vector profiling for TEM samples

Applied surface science 2008
Vol.255 p. 1400-1403
M. Nojima, M. Fujii, Y. Ishizaki, M. Owari and Y. Nihei

X-Ray photoelectron diffraction study on the surface and interface structure of VO2/TiO2 model catalyst

e-journal of surface science and nanotechnology 2008
Vol. 6 p. 272-275
S. Miyasaka, A. Suzuki, M. Nojima, M. Owari and Y. Nihei