2008年 研究発表
レーザー補助広角３次元アトムプローブの開発と実デバイスの３次元原子レベル解析(II)
2008.5.14 マイクロビームアナリシス141委員会 第132回研究会資料 p.103-108
間山憲仁、三上素直、岩田達夫、野島 雅、谷口昌宏、尾張真則
New concepts for sample preparation on 3DAP using FIB
2008.7.1 Rouen Normandy France Abstracts of 51th international field emission
symposium p.107-108
S. Mikami, T. Kaito, T. Adachi, N. Mayama, T. Iwata, M. Nojima, M. Taniguchi,
M. Owari
Shave-off depth profiling for electrochemical migration
2008.7.17 Seikei University Abstracts of 10th international symposium on SIMS
and related techniques based on ion-solid interactions at Seikei university
p.19
M. Nojima, M. Fujii, M. Owari and Y. Nihei
Highly accurate shave-off depth profiling by simulation method
2008.7.17 Seikei University Abstracts of 10th international symposium on SIMS
and related techniques based on ion-solid interactions at Seikei university
p.20
M. Fujii, M. Nojima, M. Owari and Y. Nihei
Characterization of environmental nanoparticles
2008.7.17 Seikei University Abstracts of 10th international symposium on SIMS
and related techniques based on ion-solid interactions at Seikei university
p.33
N. Fukuhara, M. Nojima and Y. Nihei
大気環境汚中ナノ粒子のキャラクタリゼ—ション
日本分析化学会第57年会 2008.9.12 p.212
福原 渚、野島 雅、二瓶好正
X線光電子回折によるVO2/TiO2モデル触媒の構造解析
2008.9.12 p.17 日本分析化学会第57年会
宮坂真弥、鈴木篤史、野島 雅、尾張真則、二瓶好正
Multi lane shave-off profiling for build-up circuit
2008.09.22 Abstract of the 17th international workshop on inelastic ion-surface
collisions p. 28
M. Fujii, Y. Ishizaki, M. Nojima, M. Owari and Y. Nihei
Discussion of shave-off profiling speed
2008.09.22 Abstract of the 17th international workshop on inelastic ion-surface
collisions p. 37
M. Nojima, M. Fujii, Y. Ishizaki, M. Owari and Y. Nihei
X-ray photoelectron diffraction study on the surface structure of VOX/TiO2(110) model catalyst
2008.11.13 Abstracts of international symposium on surface and science and
nanotechnology p.594
S. Miyasaka, A. Suzuki, M. Nojima, M. Owari and Y. Nihei
2008年 発表論文
社団法人日本表面化学会の発足を祝って
表面科学 (2008) 第29巻, 第8号, p 462-263
二瓶好正
科学と技術の国際競争力
化学と工業 2008年 11月号 第61巻, 第11号, p 1029
二瓶好正
強力二色X線源の開発
表面科学, 2008年3月
第29巻，第3号, p. 193-194
鈴木篤史, 橋本明奈, 尾張真則, 野島 雅, 二瓶好正
Study on dynamics of surface structure by rapid and time-resolved X-ray photoelectron diffraction
Surface and interface analysis 2008
Vol. 40 Issue 13 p. 1646-1649
Y. Kisaka, A. Hashimoto, A. Suzuki, S. Miyasaka, M. Nojima, M. Owari and Y.
Nihei
Differential photoelectron holography of Cu(100) surface by using of laboratory-level X-ray sources
Surface and interface analysis 2008
Vol. 40 Issue 13 p. 1638-1640
A. Hashimoto, A. Suzuki, Y. Kisaka, S. Miyasaka, M. Nojima, M. Owari and Y.
Nihei
Holographic imaging of TiO2(110) strucure by differential photoelectron holography
Surface and interface analysis 2008
Vol. 40 Issue 13 p. 1627-1630
A. Suzuki, A. Hashimoto, M. Nojima, M. Owari and Y. Nihei
Surface structual analysis of VOX/TiO2 by X-ray photoelectron diffraction
Surface and interface analysis 2008
Vol. 40 Issue 13 p. 1650-1654
S. Miyasaka, K. Amano, M. Nojima, M. Owari and Y. Nihei
Evaluation of the instrument for three-dimensional atom probe (3DAP)
Surface and interface analysis 2008
Vol. 40 Issue 13 p. 1688-1691
T. Kaneko, S. Ito, C. Yamashita, N. Mayama, M. Nojima, M. Taniguchi and M.
Owari
The stress of the needle specimen on the three-dimensional atom probe (3DAP)
Surface and interface analysis 2008
Vol. 40 Issue 13 p. 1610-1613
N. Mayama, C. Yamashita, T. Kaito, M. Nojima, M. Taniguchi and M. Owari
Development of preset-type sample stage in three-dimensional atom probe
Surface and interface analysis 2008
Vol. 40 Issue 13 p. 1696-1700
S. Ito, T. Kaneko, C. Yamashita, T. Kaito, T. Adachi, N. Mayama, M. Nojima, M. Taniguchi and M. Owari
Charge neutralization using secondary electron shower for shave-off depth profiling
Applied surface science 2008
Vol.255 p. 1351-1353
Y. Ishizaki, T. Yamamoto, M. Fujii, M. Owari and Y. Nihei
Highly accurate shave-off depth profiling by simulation method
Applied surface science 2008
Vol.255 p. 1354-1356
M. Fujii, K. Nakamura, Y. Ishizaki, M. Nojima, M. Owari and Y. Nihei
Shave-off vector profiling for TEM samples
Applied surface science 2008
Vol.255 p. 1400-1403
M. Nojima, M. Fujii, Y. Ishizaki, M. Owari and Y. Nihei
X-Ray photoelectron diffraction study on the surface and interface structure of VO2/TiO2 model catalyst
e-journal of surface science and nanotechnology 2008
Vol. 6 p. 272-275
S. Miyasaka, A. Suzuki, M. Nojima, M. Owari and Y. Nihei